Investigation of Radiation Attenuation Parameters in Aluminum-Based Alloys by Means of Phy-X/PSD

Öz

In this study, the interactions of high-aluminum ETIAL series alloys, which possess different weight ratios and a density range of 2.66–2.76 g cm⁻³, with gamma photons were examined using the Phy-X/PSD software over the 10⁻³–10⁵ MeV energy range as well as at selected photon energies (0.059, 0.081, 0.356, 0.662, 1.173, and 1.332 MeV). The mass and linear attenuation coefficients (MAC, LAC), half-value layer (HVL), tenth-value layer (TVL), mean free path (MFP), and effective atomic number (Zeff) were calculated. At lower photon energies, the dominance of the photoelectric effect led to an increase in MAC, LAC, and Zeff values, while HVL, TVL, and MFP values decreased accordingly. In the intermediate energy region, Compton scattering became the predominant interaction, resulting in decreased MAC and LAC values and increased HVL, TVL, and MFP. At higher photon energies, both Compton scattering and pair production processes became significant, leading to the stabilization of these parameters. Evaluations at selected energies indicate that at low energies, the S5 alloy (0.059 MeV, MAC = 0.3489 cm² g⁻¹, LAC = 93.1595 cm⁻¹) exhibits the highest shielding performance, whereas at medium and high energies, the S2 alloy demonstrates a more balanced absorption capability. The alloy composition and density were found to play a crucial role in determining the gamma-ray attenuation performance. This work represents the first systematic investigation in the literature to comprehensively present the attenuation parameters of these alloys.

Anahtar Kelimeler

• Alloys
• Radiation shielding
• Phy-X/PSD
• Radiation attenuation parameters

Alüminyum Bazlı Alaşımlarda Radyasyon Zayıflama Parametrelerinin Phy-X/PSD ile İncelenmesi

Öz

Bu çalışmada, farklı ağırlık oranlarına ve 2,66–2,76 g cm⁻³ yoğunluk aralığına sahip yüksek alüminyum içerikli ETİAL serisi alaşımların gama fotonlarıyla etkileşimleri, 10⁻³–10⁵ MeV enerji aralığı boyunca ve seçili foton enerjilerinde (0.059, 0.081, 0.356, 0.662, 1.173 ve 1.332 MeV) Phy-X/PSD yazılımı kullanılarak incelenmiştir. Kütle ve doğrusal zayıflama katsayıları (MAC, LAC), yarı ve ondalık değer kalınlıkları (HVL, TVL), ortalama serbest yol (MFP) ve etkin atom numarası (Zeff) hesaplanmıştır. Düşük enerji aralığında fotoelektrik etkinin baskın hale gelmesi, MAC, LAC ve Zeff değerlerinin artmasına; buna karşın HVL, TVL ve MFP değerlerinin azalmasına neden olmuştur. Orta enerjilerde Compton saçılması hâkim olup, MAC ve LAC azalmış, HVL, TVL ve MFP artmıştır. Yüksek enerjilerde Compton ve çift oluşum süreçleri belirginleşmiş ve parametreler sabitlenmiştir. Seçili enerjilerde yapılan değerlendirmeler, düşük enerjilerde S5 alaşımının (0,059 MeV’de MAC = 0,3489 cm² g-1, LAC = 93,1595 cm⁻¹) en yüksek zırhlama performansına sahip olduğunu, orta ve yüksek enerjilerde ise S2 alaşımının daha dengeli soğurma kapasitesi sunduğunu göstermektedir. Alaşımların bileşimi ve yoğunluğu, gama ışını zayıflatma performansında belirleyici rol oynamaktadır. Bu çalışma, söz konusu alaşımların zayıflatma parametrelerini literatürde sistematik olarak ortaya koyan ilk araştırmadır.

Anahtar Kelimeler

• Alaşımlar
• Radyasyon kalkanlama
• Phy-X/PSD
• Radyasyon zayıflama parametreleri

Kaynakça

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