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Gökhan Ergen
Post Graduate
BURSA TEKNİK ÜNİVERSİTESİ
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0000-0003-4236-6783
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Summary
Publications
Peer Review
Research Fields
Planning and Decision Making
Semiconductors
Mechatronics Engineering
Institution
BURSA TEKNİK ÜNİVERSİTESİ
Publications
Development of a Deep Learning Based Decision Support Method for Defect Classifications in Semiconductor Wafer Maps
Authors:
Gökhan Ergen
,
Ekrem Düven
Published: 2023 ,
Uludağ Üniversitesi Mühendislik Fakültesi Dergisi
DOI: 10.17482/uumfd.1282062
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Uludağ Üniversitesi Mühendislik Fakültesi Dergisi
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