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Abdülmecit Türüt
Publication
2
Review
1
CrossRef Cited
6
2
Publication
1
Review
6
CrossRef Cited
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Publications
The Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer
Authors:
Mehmet Can Özdemir
,
Ömer Sevgili
,
İkram Orak
,
Abdülmecit Türüt
Published: 2020 ,
Journal of the Institute of Science and Technology
DOI: 10.21597/jist.612518
FAVORITE
0
TOTAL DOWNLOAD COUNT
1575
0
FAVORITE
1575
TOTAL DOWNLOAD COUNT
Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer
Authors:
Muhammed Can Özdemir
,
Ömer Sevgili
,
İkram Orak
,
Abdülmecit Türüt
Published: 2019 ,
International Journal of Chemistry and Technology
DOI: 10.32571/ijct.642886
FAVORITE
0
TOTAL DOWNLOAD COUNT
589
0
FAVORITE
589
TOTAL DOWNLOAD COUNT
Articles published in
International Journal of Chemistry and Technology
Journal of the Institute of Science and Technology
Editorial Board Memberships
Journal of the Institute of Science and Technology
Reviews
Journal of the Institute of Science and Technology
Publications
The Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer
Authors:
Mehmet Can Özdemir
,
Ömer Sevgili
,
İkram Orak
,
Abdülmecit Türüt
Published: 2020 ,
Journal of the Institute of Science and Technology
DOI: 10.21597/jist.612518
CITED
4
FAVORITE
0
TOTAL DOWNLOAD COUNT
1575
4
CITED
0
FAVORITE
1575
TOTAL DOWNLOAD COUNT
Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer
Authors:
Muhammed Can Özdemir
,
Ömer Sevgili
,
İkram Orak
,
Abdülmecit Türüt
Published: 2019 ,
International Journal of Chemistry and Technology
DOI: 10.32571/ijct.642886
CITED
2
FAVORITE
0
TOTAL DOWNLOAD COUNT
589
2
CITED
0
FAVORITE
589
TOTAL DOWNLOAD COUNT
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