Muhammed Can Özdemir profile image
Muhammed Can Özdemir Post Graduate
Publication 2 Review 0 CrossRef Cited 7
2 Publication
0 Review
7 CrossRef Cited

Research Fields

Artificial Intelligence Control Theoryand Applications Power Electronics Nanotechnology

Institution

Publications

The Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer
Authors: Mehmet Can Özdemir , Ömer Sevgili , İkram Orak , Abdülmecit Türüt
Published: 2020 , Journal of the Institute of Science and Technology
DOI: 10.21597/jist.612518
FAVORITE 0 TOTAL DOWNLOAD COUNT 1896

0

1896

Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer
Authors: Muhammed Can Özdemir , Ömer Sevgili , İkram Orak , Abdülmecit Türüt
Published: 2019 , International Journal of Chemistry and Technology
DOI: 10.32571/ijct.642886
FAVORITE 0 TOTAL DOWNLOAD COUNT 736

0

736

Articles published in
International Journal of Chemistry and Technology
International Journal of Chemistry and Technology
Journal of the Institute of Science and Technology
Journal of the Institute of Science and Technology
User doesn't have any peer review duties on DergiPark.

Publications

The Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer
Authors: Mehmet Can Özdemir , Ömer Sevgili , İkram Orak , Abdülmecit Türüt
Published: 2020 , Journal of the Institute of Science and Technology
DOI: 10.21597/jist.612518
CITED 4 FAVORITE 0 TOTAL DOWNLOAD COUNT 1896

4

0

1896

Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer
Authors: Muhammed Can Özdemir , Ömer Sevgili , İkram Orak , Abdülmecit Türüt
Published: 2019 , International Journal of Chemistry and Technology
DOI: 10.32571/ijct.642886
CITED 3 FAVORITE 0 TOTAL DOWNLOAD COUNT 736

3

0

736

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