Researchers İkram Orak
İkram Orak profile image
İkram Orak Assoc. Prof. Bingöl Üniversitesi Sağlık hizmetleri meslek yüksek okulu
Publication 8 Review 10 CrossRef Cited 31
8 Publication
10 Review
31 CrossRef Cited

Research Fields

Physical Sciences

Institution

Bingöl Üniversitesi Sağlık hizmetleri meslek yüksek okulu

Publications

The Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer
Authors: Mehmet Can Özdemir , Ömer Sevgili , İkram Orak , Abdülmecit Türüt
Published: 2020 , Journal of the Institute of Science and Technology
DOI: 10.21597/jist.612518
FAVORITE 0 TOTAL DOWNLOAD COUNT 1398

0

1398

Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer
Authors: Muhammed Can Özdemir , Ömer Sevgili , İkram Orak , Abdülmecit Türüt
Published: 2019 , International Journal of Chemistry and Technology
DOI: 10.32571/ijct.642886
FAVORITE 0 TOTAL DOWNLOAD COUNT 529

0

529

The Thin Film Phototransistor Cell with Silver Interfacial Layer
Authors: İkram Orak
Published: 2019 , Turkish Journal of Nature and Science
DOI: -
FAVORITE 0 TOTAL DOWNLOAD COUNT 619

0

619

Catalyst-Free Synthesis of Thiosemicarbazone and Rhodanine derivatives and Their Schottky Diode Applications
Authors: Sinan Bayındır, Mehmet Akif Şahinkaya, İkram Orak
Published: 2019 , Journal of the Institute of Science and Technology
DOI: 10.21597/jist.534846
FAVORITE 0 TOTAL DOWNLOAD COUNT 570

0

570

Electrical characteristics of Au/Ti/HfO2/n-GaAs metal-insulator-semiconductor structures with high-k interfacial layer
Authors: Abdulkerim Karabulut , İkram Orak , Abdülmecit Türüt
Published: 2018 , International Journal of Chemistry and Technology
DOI: 10.32571/ijct.456902
FAVORITE 0 TOTAL DOWNLOAD COUNT 887

0

887

The thickness effect of insulator layer between the semiconductor and metal contact on C-V characteristics of Al/Si3N4/p-Si device
Authors: İkram Orak , Adem Koçyiğit
Published: 2017 , Pamukkale University Journal of Engineering Sciences
DOI: -
FAVORITE 0 TOTAL DOWNLOAD COUNT 825

0

825

Photovoltaic and Electrical Properties of Al/ Ruthenium (II)-complex / p-Si Photodiode
Authors: Hülya Doğan , İkram Orak , Nezir Yıldırım
Published: 2017 , Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi
DOI: 10.17776/cumuscij.297189
FAVORITE 0 TOTAL DOWNLOAD COUNT 1380

0

1380

The Effects of Thermal Annealing and Sample Temperature on Current-Voltage Characteristics of Au/n-Si/Al Schottky Diodes
Authors: Nezir Yıldırım , Mücahide Göndük, İkram Orak
Published: 2017 , Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi
DOI: 10.17776/cumuscij.298666
FAVORITE 0 TOTAL DOWNLOAD COUNT 1817

0

1817

Articles published in
Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi
Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi
International Journal of Chemistry and Technology
International Journal of Chemistry and Technology
Journal of the Institute of Science and Technology
Journal of the Institute of Science and Technology
Pamukkale University Journal of Engineering Sciences
Pamukkale University Journal of Engineering Sciences
Turkish Journal of Nature and Science
Turkish Journal of Nature and Science
Editorship
Journal of the Institute of Science and Technology
Journal of the Institute of Science and Technology
Section Editor
Editorial Board Memberships
Journal of the Institute of Science and Technology
Journal of the Institute of Science and Technology

Reviews

Duzce University Journal of Science and Technology
Duzce University Journal of Science and Technology
Eskişehir Teknik Üniversitesi Bilim ve Teknoloji Dergisi B - Teorik Bilimler
Eskişehir Teknik Üniversitesi Bilim ve Teknoloji Dergisi B - Teorik Bilimler
Gazi University Journal of Science
Gazi University Journal of Science
Journal of the Institute of Science and Technology
Journal of the Institute of Science and Technology
Yuzuncu Yil University Journal of the Institute of Natural and Applied Sciences
Yuzuncu Yil University Journal of the Institute of Natural and Applied Sciences

Publications

The Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer
Authors: Mehmet Can Özdemir , Ömer Sevgili , İkram Orak , Abdülmecit Türüt
Published: 2020 , Journal of the Institute of Science and Technology
DOI: 10.21597/jist.612518
CITED 3 FAVORITE 0 TOTAL DOWNLOAD COUNT 1398

3

0

1398

Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer
Authors: Muhammed Can Özdemir , Ömer Sevgili , İkram Orak , Abdülmecit Türüt
Published: 2019 , International Journal of Chemistry and Technology
DOI: 10.32571/ijct.642886
CITED 2 FAVORITE 0 TOTAL DOWNLOAD COUNT 529

2

0

529

Catalyst-Free Synthesis of Thiosemicarbazone and Rhodanine derivatives and Their Schottky Diode Applications
Authors: Sinan Bayındır, Mehmet Akif Şahinkaya, İkram Orak
Published: 2019 , Journal of the Institute of Science and Technology
DOI: 10.21597/jist.534846
CITED 2 FAVORITE 0 TOTAL DOWNLOAD COUNT 570

2

0

570

Electrical characteristics of Au/Ti/HfO2/n-GaAs metal-insulator-semiconductor structures with high-k interfacial layer
Authors: Abdulkerim Karabulut , İkram Orak , Abdülmecit Türüt
Published: 2018 , International Journal of Chemistry and Technology
DOI: 10.32571/ijct.456902
CITED 22 FAVORITE 0 TOTAL DOWNLOAD COUNT 887

22

0

887

Photovoltaic and Electrical Properties of Al/ Ruthenium (II)-complex / p-Si Photodiode
Authors: Hülya Doğan , İkram Orak , Nezir Yıldırım
Published: 2017 , Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi
DOI: 10.17776/cumuscij.297189
CITED 2 FAVORITE 0 TOTAL DOWNLOAD COUNT 1380

2

0

1380

Popular Publications: It is determined automatically by the researchers doing research in DergiPark according to the statistics of being added to the favorites. CrossRef Cited: The citations shown in DergiPark are drawn from CrossRef. For this, the cited and cited articles must be registered in CrossRef (DOI number). ^: Citation numbers are reflected in the system by DergiPark at certain periods.
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