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İkram Orak
Assoc. Prof.
Bingöl Üniversitesi Sağlık hizmetleri meslek yüksek okulu
Publication
8
Review
10
CrossRef Cited
32
8
Publication
10
Review
32
CrossRef Cited
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Summary
Publications
Peer Review
Cited
Research Fields
Physical Sciences
Institution
Bingöl Üniversitesi Sağlık hizmetleri meslek yüksek okulu
Publications
The Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer
Authors:
Mehmet Can Özdemir
,
Ömer Sevgili
,
İkram Orak
,
Abdülmecit Türüt
Published: 2020 ,
Journal of the Institute of Science and Technology
DOI: 10.21597/jist.612518
FAVORITE
0
TOTAL DOWNLOAD COUNT
1575
0
FAVORITE
1575
TOTAL DOWNLOAD COUNT
Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer
Authors:
Muhammed Can Özdemir
,
Ömer Sevgili
,
İkram Orak
,
Abdülmecit Türüt
Published: 2019 ,
International Journal of Chemistry and Technology
DOI: 10.32571/ijct.642886
FAVORITE
0
TOTAL DOWNLOAD COUNT
589
0
FAVORITE
589
TOTAL DOWNLOAD COUNT
The Thin Film Phototransistor Cell with Silver Interfacial Layer
Authors:
İkram Orak
Published: 2019 ,
Turkish Journal of Nature and Science
DOI: -
FAVORITE
0
TOTAL DOWNLOAD COUNT
658
0
FAVORITE
658
TOTAL DOWNLOAD COUNT
Catalyst-Free Synthesis of Thiosemicarbazone and Rhodanine derivatives and Their Schottky Diode Applications
Authors: Sinan Bayındır, Mehmet Akif Şahinkaya,
İkram Orak
Published: 2019 ,
Journal of the Institute of Science and Technology
DOI: 10.21597/jist.534846
FAVORITE
0
TOTAL DOWNLOAD COUNT
638
0
FAVORITE
638
TOTAL DOWNLOAD COUNT
Electrical characteristics of Au/Ti/HfO2/n-GaAs metal-insulator-semiconductor structures with high-k interfacial layer
Authors:
Abdulkerim Karabulut
,
İkram Orak
,
Abdülmecit Türüt
Published: 2018 ,
International Journal of Chemistry and Technology
DOI: 10.32571/ijct.456902
FAVORITE
0
TOTAL DOWNLOAD COUNT
945
0
FAVORITE
945
TOTAL DOWNLOAD COUNT
The thickness effect of insulator layer between the semiconductor and metal contact on C-V characteristics of Al/Si3N4/p-Si device
Authors:
İkram Orak
,
Adem Koçyiğit
Published: 2017 ,
Pamukkale University Journal of Engineering Sciences
DOI: -
FAVORITE
0
TOTAL DOWNLOAD COUNT
893
0
FAVORITE
893
TOTAL DOWNLOAD COUNT
Photovoltaic and Electrical Properties of Al/ Ruthenium (II)-complex / p-Si Photodiode
Authors:
Hülya Doğan
,
İkram Orak
,
Nezir Yıldırım
Published: 2017 ,
Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi
DOI: 10.17776/cumuscij.297189
FAVORITE
0
TOTAL DOWNLOAD COUNT
1485
0
FAVORITE
1485
TOTAL DOWNLOAD COUNT
The Effects of Thermal Annealing and Sample Temperature on Current-Voltage Characteristics of Au/n-Si/Al Schottky Diodes
Authors:
Nezir Yıldırım
, Mücahide Göndük,
İkram Orak
Published: 2017 ,
Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi
DOI: 10.17776/cumuscij.298666
FAVORITE
0
TOTAL DOWNLOAD COUNT
1905
0
FAVORITE
1905
TOTAL DOWNLOAD COUNT
Articles published in
Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi
International Journal of Chemistry and Technology
Journal of the Institute of Science and Technology
Pamukkale University Journal of Engineering Sciences
Turkish Journal of Nature and Science
Editorship
Journal of the Institute of Science and Technology
Section Editor
Editorial Board Memberships
Journal of the Institute of Science and Technology
Reviews
Duzce University Journal of Science and Technology
Eskişehir Teknik Üniversitesi Bilim ve Teknoloji Dergisi B - Teorik Bilimler
Gazi University Journal of Science
Journal of the Institute of Science and Technology
Yuzuncu Yil University Journal of the Institute of Natural and Applied Sciences
Publications
The Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer
Authors:
Mehmet Can Özdemir
,
Ömer Sevgili
,
İkram Orak
,
Abdülmecit Türüt
Published: 2020 ,
Journal of the Institute of Science and Technology
DOI: 10.21597/jist.612518
CITED
4
FAVORITE
0
TOTAL DOWNLOAD COUNT
1575
4
CITED
0
FAVORITE
1575
TOTAL DOWNLOAD COUNT
Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer
Authors:
Muhammed Can Özdemir
,
Ömer Sevgili
,
İkram Orak
,
Abdülmecit Türüt
Published: 2019 ,
International Journal of Chemistry and Technology
DOI: 10.32571/ijct.642886
CITED
2
FAVORITE
0
TOTAL DOWNLOAD COUNT
589
2
CITED
0
FAVORITE
589
TOTAL DOWNLOAD COUNT
Catalyst-Free Synthesis of Thiosemicarbazone and Rhodanine derivatives and Their Schottky Diode Applications
Authors: Sinan Bayındır, Mehmet Akif Şahinkaya,
İkram Orak
Published: 2019 ,
Journal of the Institute of Science and Technology
DOI: 10.21597/jist.534846
CITED
2
FAVORITE
0
TOTAL DOWNLOAD COUNT
638
2
CITED
0
FAVORITE
638
TOTAL DOWNLOAD COUNT
Electrical characteristics of Au/Ti/HfO2/n-GaAs metal-insulator-semiconductor structures with high-k interfacial layer
Authors:
Abdulkerim Karabulut
,
İkram Orak
,
Abdülmecit Türüt
Published: 2018 ,
International Journal of Chemistry and Technology
DOI: 10.32571/ijct.456902
CITED
22
FAVORITE
0
TOTAL DOWNLOAD COUNT
945
22
CITED
0
FAVORITE
945
TOTAL DOWNLOAD COUNT
Photovoltaic and Electrical Properties of Al/ Ruthenium (II)-complex / p-Si Photodiode
Authors:
Hülya Doğan
,
İkram Orak
,
Nezir Yıldırım
Published: 2017 ,
Cumhuriyet Üniversitesi Fen Edebiyat Fakültesi Fen Bilimleri Dergisi
DOI: 10.17776/cumuscij.297189
CITED
2
FAVORITE
0
TOTAL DOWNLOAD COUNT
1485
2
CITED
0
FAVORITE
1485
TOTAL DOWNLOAD COUNT
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